The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2010

Filed:

Aug. 26, 2004
Applicants:

Hironori Emaru, Yokohama, JP;

Masaharu Akatsu, Machida, JP;

Norifumi Nishikawa, Machida, JP;

Tetsuo Tanaka, Sagamihara, JP;

Akihiro Yoshikawa, Kawasaki, JP;

Shunsuke Akifuji, Wako, JP;

Gou Kojima, Yamato, JP;

Inventors:

Hironori Emaru, Yokohama, JP;

Masaharu Akatsu, Machida, JP;

Norifumi Nishikawa, Machida, JP;

Tetsuo Tanaka, Sagamihara, JP;

Akihiro Yoshikawa, Kawasaki, JP;

Shunsuke Akifuji, Wako, JP;

Gou Kojima, Yamato, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a performance monitoring method of a processing flow that, in a distributed object system, a processing is completed after going by way of processing of several objects through objects. A collector collects, as performance data, a receiving time of a message from the other object and a sending time of a message to the other for an object that becomes a measurement target on each computer. A manager puts received performance data together and calculates and displays a processing time of each object that constitutes a processing flow and a communication time between objects.


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