The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Mar. 27, 2006
Applicants:
Yoshio Inoue, Kasugai, JP;
Takashi Yoneda, Kasugai, JP;
Masaru Ito, Kasugai, JP;
Inventors:
Assignee:
Fujitsu Semiconductor Limited, Yokohama, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for efficiently extracting a variation distribution of a characteristic for a semiconductor integrated circuit. The method extracts a characteristic distribution of a semiconductor integrated circuit by performing a mathematical analysis using a polynomial expression based on a variation distribution of a process sensitivity parameter.