The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Sep. 29, 2008
Ruey-der Lou, Hsinchu, TW;
Ruey-Der Lou, Hsinchu, TW;
IMU Solutions, Inc., , TW;
Abstract
A method is disclosed in this invention for calibrating an offset Vand sensitivity Vfor an accelerometer implemented in a level gauge having a known value of an offset angle θand a known value of a relative angle between top-and-bottom surface θ. The method includes a step of placing the level gauge implemented with the accelerometer on a table-top surface having a tilt angle θand measuring a tilt angle θfrom the level gauge and an output voltage Vfrom the accelerometer, then rotating the level gauge 180 degrees on the table-top surface along a perpendicular axis relative to the table top surface and measuring a tilt angle θfrom the level gauge and measuring an output voltage Vfrom the accelerometer. Then, the method proceeds with a step of flipping the level gauge upside down on the table-top surface and measuring a tilt angle θfrom the level gauge and an output voltage Vfrom the accelerometer for calculating a tilt angle θof the table-top surface and the offset Vand sensitivity Vof the accelerometer.