The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Nov. 01, 2005
Sankar Nair, Atlanta, GA (US);
Soumendu Bhattacharya, Atlanta, GA (US);
Vishwanath Natarajan, Atlanta, GA (US);
Abhijit Chatterjee, Atlanta, GA (US);
Sankar Nair, Atlanta, GA (US);
Soumendu Bhattacharya, Atlanta, GA (US);
Vishwanath Natarajan, Atlanta, GA (US);
Abhijit Chatterjee, Atlanta, GA (US);
Georgia Institute of Technology, Atlanta, GA (US);
Abstract
Systems and methods are disclosed for evaluating the length of elongated elements in a sample. The disclosed systems and methods may include using a direct current stimulus to determine a direct current base length region corresponding to at least a portion of the sample. Furthermore, the disclosed systems and methods may include using an alternating current stimulus to determine that the direct current base length region corresponds to a first set of elongated elements and a second set of elongated elements. The first set of elongated elements may have a first base length and the second set of elongated elements may have a second base length. The elongated elements may comprise, for example, chain molecules, deoxyribonucleic acid (DNA), ribonucleic acid (RNA), or proteins. Furthermore, the disclosed systems and methods may include measuring an ion current through a nanopore, the ion current produced by the alternating current stimulus.