The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Jul. 25, 2006
Gregory M. Palmer, Durham, NC (US);
Nirmala Ramanujam, Chapel Hill, NC (US);
Gregory M. Palmer, Durham, NC (US);
Nirmala Ramanujam, Chapel Hill, NC (US);
Wisconsin Alumni Research Foundation, Madison, WI (US);
Duke University, Durham, NC (US);
Abstract
Methods, systems, and computer program products for optimizing a probe geometry for spectroscopic measurement in a turbid medium are provided. A probe geometry comprising one emitting entity and at least on collecting entity is selected. A simulation is performed to generate optical parameter values measured by the probe geometry. The measured optical parameter values are input to an inversion algorithm to produce corresponding optical properties as output. The produced optical properties are compared with known optical properties known and a degree of matching between the produced optical properties and the known optical properties is determined. The simulation and inversion steps are repeated for a plurality of additional probe geometries, each differing in at least one property. An optimization algorithm is applied at each iteration to select an optimal probe geometry.