The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Oct. 24, 2007
Jinsoup Joung, Seongnam-si, KR;
Kyeong Min Ha, Seongnam-si, KR;
Seung Hwan Ji, Seongnam-si, KR;
Jun Wan Park, Seoul, KR;
Jae Sung Lee, Incheon, KR;
Jinsoup Joung, Seongnam-si, KR;
Kyeong Min Ha, Seongnam-si, KR;
Seung Hwan Ji, Seongnam-si, KR;
Jun Wan Park, Seoul, KR;
Jae Sung Lee, Incheon, KR;
Innowireless Co., Ltd., Seongnam-si, KR;
Abstract
Disclosed herein is a method for generating a test signal for testing the accuracy of the CINR measurement of a subscriber station. The method includes step (a) of checking a preamble code corresponding to a predetermined cell ID, reading corresponding preamble data from a preamble code table, and taking it as desired preamble data, step (b) of completing generation of desired signal data by generating desired pilot data and various information data, step (c) of randomly selecting one preamble code from among preamble codes corresponding to cell IDs other than the cell ID, reading corresponding preamble data from the preamble code table, and taking the preamble data as interference preamble data, step (d) of generating interference pilot data, and step (e) of generating test signal data by adding the interference preamble data and the interference pilot data to the desired signal data.