The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Oct. 17, 2006
Doug Mcfadyen, Delta, CA;
Tatiana Pavlovna Kadantseva, Vancouver, CA;
Doug McFadyen, Delta, CA;
Tatiana Pavlovna Kadantseva, Vancouver, CA;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A method for adjusting an image projected onto a warped surface is provided. The method initiates with capturing calibration points within a calibration image projected onto the warped surface. The method includes analyzing the calibration points to determine relative locations among the calibration points. In one embodiment, the method utilizes a pseudo origin for locating beginning points for successive rows of calibration points. The calibration points are ordered according to the relative locations. The ordered calibration points may be applied to alter the image data prior to projection of the image data onto the warped surface. A system for calibrating points so that an image projected onto a warped surface does not appear as distorted is also provided.