The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Oct. 16, 2007
Dominic J. Heuscher, Aurora, OH (US);
Randall P. Luhta, Highland Heights, OH (US);
Marc A. Chappo, Elyria, OH (US);
Rainer Pietig, Herzogenrath, DE;
Dominic J. Heuscher, Aurora, OH (US);
Randall P. Luhta, Highland Heights, OH (US);
Marc A. Chappo, Elyria, OH (US);
Rainer Pietig, Herzogenrath, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A computed tomography method includes rotating an electron beam along an anode () disposed about an examination region () for a plurality of sampling intervals in which x-ray projections are sampled. The electron beam is swept during each sampling interval to generate a plurality of successive focal spots at different focal spot locations during each sampling interval, wherein the focal spots generated in a given sampling interval include a sub-set of the focal spots generated in a previous sampling interval. The x-ray projections radiated from each of the plurality of focal spots is sampled during each sampling interval. The resulting data is reconstructed to generate volumetric image data.