Method for scattered radiation correction in x-ray imaging devices

Abstract

A method is disclosed for scattered radiation correction in x-ray imaging devices having a number of x-ray sources that can be moved around an examination object in at least one scanning plane during a measurement pass. During the measurement pass, a number of x-ray projections are recorded at different projection angles with simultaneous use of the x-ray sources. In at least one embodiment of the present method, parameters characterizing an outer object contour are determined in the scanning plane from measured data of different x-ray projections. In at least one embodiment, on the basis of one object contour section whose characterizing parameters have been determined from x-ray projections that lie in front of and/or behind the respective x-ray projection by a defined projection angle range, for each x-ray projection an assigned scattered radiation distribution is then retrieved or is interpolated in a database from scattered radiation distributions for object contour sections with similar characterizing parameters. This scattered radiation distribution is then used for the correction of the measured data for the respective x-ray projection. In at least one embodiment, the method enables scattered radiation correction in conjunction with operation of the x-ray sources.