The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Nov. 03, 2006
Toshiki Shimizu, Tokyo, JP;
Jumpei Kura, Kanagawa, JP;
Mariko Fukuyama, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
An evaluation value calculating apparatus includes the following elements. A difference metric selecting unit selects a difference metric for a specific recorded sequence in recorded sequences obtained in a maximum likelihood decoding process when information expressed with marks and spaces on a recording medium is played back, the difference metric being obtained in the maximum likelihood decoding process. A difference metric error value calculating unit determines a difference metric error value for the selected difference metric using a calculation method that is selected according to an edge shift direction of each of the marks on a time axis, the difference metric error value representing an error from an ideal difference metric and the edge shift direction on the time axis. A statistical processing unit performs statistical processing on the determined difference metric error value on the basis of each of states of path meeting points to generate an evaluation value.