The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Mar. 05, 2008
Sang-hyub Lee, Suwon-si, KR;
Hae-jung Lee, Suwon-si, KR;
Sang-hyub Lee, Suwon-si, KR;
Hae-jung Lee, Suwon-si, KR;
Samsung Electronics Co. Ltd, Suwon-si, KR;
Abstract
An apparatus and method of setting up a bit error rate (BER) criterion and an apparatus and method of performing a burn-in test using the method of setting up the BER criterion. The method of setting the BER criterion includes measuring temperatures of hard disc drives (HDDs), and changing a BER criterion in which, if the measured temperature of the HDD is higher than an optimum temperature for a burn-in test, a new BER criterion having a value greater than the BER criterion of the optimum temperature is set up, and, if the measured temperature of the HDD is lower than an optimum temperature for a burn-in test, a new BER criterion having a value less than the BER criterion of the optimum temperature is set up.