The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2010

Filed:

Sep. 18, 2008
Applicants:

Elmar Mayer, Nuβdorf, DE;

Johann Oberhauser, Vachendorf, DE;

Inventors:

Elmar Mayer, Nuβdorf, DE;

Johann Oberhauser, Vachendorf, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01D 5/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for absolute position measuring that includes scanning a code having code elements arranged one behind the other in a measuring direction, wherein the code elements include sequential first and second code elements which define a code word containing absolute position information. The method including generating scanning signals within the first code elements and the second code elements. The method further including forming information regarding the sequential first and second code elements from the scanning signals via a reference value and determining the reference value as a function of at least one of the scanning signals within the first code elements and the scanning signals within the second code elements.


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Mayer, Elmar. (2010). Position measuring arrangement (U.S. Patent No. 7835014). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7835014

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