The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Apr. 08, 2008
Atsushi Morosawa, Aichi, JP;
Changho Chong, Aichi, JP;
Atsushi Morosawa, Aichi, JP;
Changho Chong, Aichi, JP;
Santec Corporation, Komaki, JP;
Abstract
A tunable light sourcefor varying emission wavelength periodically and an optical interferometer are used. A reflector is disposed at a measurement position, a light interference signal is A/D converted at a regular time interval, and data numbers at timing giving peak and bottom are calculated according to a least-squares method. Based on this, an approximate equation is calculated according to polynomial approximation and a sequence including the number of exponentiation of 2 and converting the data number at a regular frequency interval is calculated. Then, by disposing a measured target at the measurement position, calculating the necessary number of pieces of data for FFT from measured data at each timing according to straight-line approximation and Fourier transforming a light beat signal obtained by an optical interferometer at regular frequency interval, a tomogram having high resolution and high sensitivity can be acquired.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile