The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Sep. 21, 2007
Se-hwan Song, Cheonan-si, KR;
Seong-youb Chung, Gwangju-si, KR;
Sung-han Kim, Daejeon, KR;
Jin-hyung Park, Daejeon, KR;
Young-jun Park, Daejeon, KR;
Jae-hoon Kim, Daejeon, KR;
Se-Hwan Song, Cheonan-si, KR;
Seong-Youb Chung, Gwangju-si, KR;
Sung-Han Kim, Daejeon, KR;
Jin-Hyung Park, Daejeon, KR;
Young-Jun Park, Daejeon, KR;
Jae-Hoon Kim, Daejeon, KR;
Samsung Heavy Ind. Co., Ltd., , KR;
Abstract
A three-dimensional measurement system using an IGPS includes a rescale bar having linear scales thereon, a linear encoder for measuring an absolute length within which the linear encoder moves on the rescale bar, a plurality of optical transmitters that radiates pan beams, and a vector bar having one end attached to the linear encoder, and having a receiver to detect the pan beams radiated from the optical transmitters, the vector bar acquiring coordinates of two points where the vector bar moves by using the receiver, and measuring a relative length from the coordinates. A ratio between the absolute length and the relative length is applied in rescaling an actual distance between two positions to be measured.