The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Sep. 10, 2007
Applicant:
Kwang-hee Lee, Gyeonggi-do, KR;
Inventor:
Kwang-Hee Lee, Gyeonggi-do, KR;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2006.01);
U.S. Cl.
CPC ...
Abstract
A random noise evaluation method is comprised of: capturing and obtaining current image data; calculating a difference between the current image data and an average of previous image data; calculating a current difference square sum using a sum of the difference and a previous difference square sum; and calculating a random noise value using the current difference square sum. Since a noise evaluation algorithm obtains random noises without storing image data for all pixels of a*b*n, it is able to evaluate random noise evaluation for a high-resolution image sensor even with a relatively small size of memory.