The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7834645 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 16, 2010

Filed:

Dec. 15, 2006
Applicant:

Koichi Yanagisawa, Nagano, JP;

Inventor:

Koichi Yanagisawa, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A variable capacitance circuit includes a capacitance changing structure constructed by connecting a first construction unit, a second construction unit, a third construction unit, and a fourth construction unit, which each include a first electric element that hinders transmission of a direct current (DC) signal and has a capacitance that changes in accordance with the magnitude of an absolute value of an applied voltage, in the mentioned order in a ring. A voltage measuring apparatus measures the voltage of a measured object and includes a detection electrode capable of being disposed facing the measured object and the variable capacitance circuit described above. A power measuring apparatus includes a current measuring apparatus that measures current flowing in a measured object and the voltage measuring apparatus that measures the voltage of the measured object.


Find Patent Forward Citations

Yanagisawa, Koichi. (2010). Variable capacitance circuit, voltage measuring apparatus, and power measuring apparatus (U.S. Patent No. 7834645). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7834645

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