The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Nov. 29, 2004
Applicants:

Sourabh Satish, Mountain View, CA (US);

Harlan Seymour, San Mateo, CA (US);

Philip Lao, San Carlos, CA (US);

John Bonamico, Morgan Hill, CA (US);

Inventors:

Sourabh Satish, Mountain View, CA (US);

Harlan Seymour, San Mateo, CA (US);

Philip Lao, San Carlos, CA (US);

John Bonamico, Morgan Hill, CA (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Detecting deviations from normal behavior in a processing system is disclosed. Independently for each of a plurality of processes associated with the processing system, a learning phase is started for the process based on a start criteria associated with the process, the normal behavior associated with the process is learned during the learning phase, the learning phase for the process is stopped based on a stop criteria associated with the process, and a protect phase is started for the process.


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