The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2010
Filed:
Jun. 03, 2003
Niloy Banerjee, Fremont, CA (US);
Bret L. Foreman, San Francisco, CA (US);
Theodore R. Haining, San Bruno, CA (US);
Parikshit Bhaduri, Foster City, CA (US);
Brom Mahbod, San Carlos, CA (US);
Michael David Kavanaugh, San Francisco, CA (US);
Dhaval Babulal Shah, Foster City, CA (US);
William Fillmore Manry, Iv, Monte Sereno, CA (US);
Henry S. Willard, San Francisco, CA (US);
John John E. SO, Dublin, CA (US);
Niloy Banerjee, Fremont, CA (US);
Bret L. Foreman, San Francisco, CA (US);
Theodore R. Haining, San Bruno, CA (US);
Parikshit Bhaduri, Foster City, CA (US);
Brom Mahbod, San Carlos, CA (US);
Michael David Kavanaugh, San Francisco, CA (US);
Dhaval Babulal Shah, Foster City, CA (US);
William Fillmore Manry, IV, Monte Sereno, CA (US);
Henry S. Willard, San Francisco, CA (US);
John John E. So, Dublin, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques for testing subsystems on a platform for a software application are provided. A test application receives instructions for calling platform dependent subsystems directly. The instructions can be designed to fully test the capabilities of the subsystems. Once the instructions are executed, the results of the subsystems can be analyzed for platform certification, performance, reliability, and/or characteristics.