The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7831880 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 09, 2010

Filed:

Jan. 25, 2006
Applicant:

Minoru Akiyama, Tokyo, JP;

Inventor:

Minoru Akiyama, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

To specify defect management information to be used in a short time in an information recording medium having a defect information area capable of recording plural sets of defect management information and a selection information area capable of recording plural sets of selection information for selecting a set of defect management information from the defect information area. The selection information includes information about a position where the latest management information at the time of writing is written, and history information indicating that the selection information is updated.


Find Patent Forward Citations

Akiyama, Minoru. (2010). Information recording medium, defect management method, information reading/writing device and information reading device (U.S. Patent No. 7831880). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7831880

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