The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7831798 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 09, 2010

Filed:

Sep. 18, 2007
Applicants:

Wang Dong Chen, Toronto, CA;

Ying Chau Raymond Mak, Thornhill, CA;

Inventors:

Wang Dong Chen, Toronto, CA;

Ying Chau Raymond Mak, Thornhill, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-implemented method including receiving a set of data having a mapping. The set of data has groups of subsets of data. The mapping describes in what order the groups of subsets of data are to be stored in a memory. The mapping also describes the offsets of the groups of subsets of data in the memory. The mapping is not changed when the set of data is stored in the memory. The method also includes determining a starting address for the set of data. The starting address corresponds to an address in the memory. The starting address is determined such that an optimum number of subsets of data in the groups of subsets of data are aligned. The method also includes storing the set of data in the memory, wherein the mapping is unaffected when the set of data is stored in the memory.


Find Patent Forward Citations

Chen, Wang. (2010). Method to achieve partial structure alignment (U.S. Patent No. 7831798). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7831798

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