The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2010
Filed:
Apr. 06, 2006
Elizabeth A. Nichols, Great Falls, VA (US);
Patrick James Mcnerthney, Makawao, HI (US);
Biao Ren, Acton, MA (US);
Elizabeth A. Nichols, Great Falls, VA (US);
Patrick James McNerthney, Makawao, HI (US);
Biao Ren, Acton, MA (US);
ClearPoint Metrics, Inc., Burlington, MA (US);
Abstract
Techniques for dynamically representing distributed information are disclosed. According to one embodiment, metrics for deployed resources in a predefined environment (e.g., an enterprise) is designed. The metrics includes at least various logic and data sources and is deployed as one or more Metrics Definition Packages (MDP), wherein data sources are used for calculating such metrics. The metrics is defined in terms of the data sources and their associated meta-data, but has no dependency upon specific external systems that are eventually used to populate the data sources when the Metrics Definition Package is executed. The metrics results from the execution of the Metrics Definition Package in accordance with the deployed resources (e.g., storage space, and security means) are represented in what is referred to as a Scorecard Definition Package (SDP) that is designed to represent the metrics results in a dynamic and comprehensible manner.