The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Feb. 21, 2008
Applicants:

Joe Eddie Leyba, Ii, Albuquerque, NM (US);

Wayne E. Wennekamp, Albuquerque, NM (US);

Schuyler E. Shimanek, Albuquerque, NM (US);

Inventors:

Joe Eddie Leyba, II, Albuquerque, NM (US);

Wayne E. Wennekamp, Albuquerque, NM (US);

Schuyler E. Shimanek, Albuquerque, NM (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of testing input signals coupled to a circuit for performing a predetermined function is disclosed. The method comprises coupling input signals to inputs of the circuit by way of programmable interconnects; controlling the paths of the input signals within the circuit from the inputs to an output of the circuit; maintaining the states of the input signals coupled to the inputs of the circuit and routed to the output of the circuit; and testing output signals of the circuit to determine whether the correct input signals were provided to the inputs of the circuit by way of the programmable interconnects. A device having programmable logic which enables testing of input signals is also disclosed.


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