The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Sep. 29, 2003
Applicants:

Charles Paul Stack, Louisville, CO (US);

Andrew Timothy Patten, Boulder, CO (US);

Marc Allan Buttler, Estes Park, CO (US);

Graeme Ralph Duffill, Boulder, CO (US);

Inventors:

Charles Paul Stack, Louisville, CO (US);

Andrew Timothy Patten, Boulder, CO (US);

Marc Allan Buttler, Estes Park, CO (US);

Graeme Ralph Duffill, Boulder, CO (US);

Assignee:

Micro Motion, Inc., Boulder, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for calculating a flow rate of a flow meter using multiple modes is provided according to an embodiment of the invention. The system for calculating a flow rate of a flow meter using multiple modes comprises a means for calibrating the flow meter for a number of desired modes. The system for calculating a flow rate of a flow meter using multiple modes includes a means for determining a density of a material flowing through the flow meter associated with each mode. The system for calculating a flow rate of a flow meter using multiple modes further includes a means for determining the flow rate effect on density for each desired mode. The system for calculating a flow rate of a flow meter using multiple modes a means for calculating a flow rate based on the density and flow rate effect on density values for each desired mode.


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