The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Nov. 25, 2005
Applicants:

Klaus Voigtlaender, Wangen, DE;

Johannes Duerr, Reutlingen, DE;

Rolf Becker, Pfullingen, DE;

Reinhold Muench, Oberriexingen, DE;

Ivica Durdevic, Reutlingen, DE;

Uwe Wostradowski, Malmsheim, DE;

Christopher Hahn, Gomaringen, DE;

Joerg Breibach, Reutlingen, DE;

Philippe Jaeckle, Gerlingen, DE;

Hendrik Ehrhardt, Ditzingen-Schoeckingen, DE;

Thomas Rupp, Herrenberg, DE;

Antoine Chabaud, Stuttgart-Stammheim, DE;

Inventors:

Klaus Voigtlaender, Wangen, DE;

Johannes Duerr, Reutlingen, DE;

Rolf Becker, Pfullingen, DE;

Reinhold Muench, Oberriexingen, DE;

Ivica Durdevic, Reutlingen, DE;

Uwe Wostradowski, Malmsheim, DE;

Christopher Hahn, Gomaringen, DE;

Joerg Breibach, Reutlingen, DE;

Philippe Jaeckle, Gerlingen, DE;

Hendrik Ehrhardt, Ditzingen-Schoeckingen, DE;

Thomas Rupp, Herrenberg, DE;

Antoine Chabaud, Stuttgart-Stammheim, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G01B 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a device are for predicting a life expectancy of a product, which includes at least two components. The life expectancy is ascertained as a function of an assumed field loading of the product. The components of the product are acted upon by different loadings and are operated, in each instance, at the different loadings until they fail. An end-of-life curve of the component is recorded on the basis of the load-dependent failure times of a component. An EOL curve of the product is ascertained such that at the different loadings, it includes the EOL curve of the components which has, in each instance, the shortest failure time at the corresponding loading. The anticipated service life of the product is determined as a functional value of the EOL curve of the product as a function of the predefined loading of the product.


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