The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2010
Filed:
Dec. 22, 2004
Rakesh Gupta, Mountain View, CA (US);
Ming-hsuan Yang, Mountain View, CA (US);
Jason Meltzer, Los Angeles, CA (US);
Rakesh Gupta, Mountain View, CA (US);
Ming-Hsuan Yang, Mountain View, CA (US);
Jason Meltzer, Los Angeles, CA (US);
Honda Motor Co., Ltd., Tokyo, JP;
Abstract
Simultaneous localization and mapping (SLAM) utilizes multiple view feature descriptors to robustly determine location despite appearance changes that would stifle conventional systems. A SLAM algorithm generates a feature descriptor for a scene from different perspectives using kernel principal component analysis (KPCA). When the SLAM module subsequently receives a recognition image after a wide baseline change, it can refer to correspondences from the feature descriptor to continue map building and/or determine location. Appearance variations can result from, for example, a change in illumination, partial occlusion, a change in scale, a change in orientation, change in distance, warping, and the like. After an appearance variation, a structure-from-motion module uses feature descriptors to reorient itself and continue map building using an extended Kalman Filter. Through the use of a database of comprehensive feature descriptors, the SLAM module is also able to refine a position estimation despite appearance variations.