The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2010
Filed:
Nov. 16, 2007
Yuichi Teramura, Ashigarakami-gun, JP;
Sadato Akahori, Ashigarakami-gun, JP;
Karin Kuroiwa, Ashigarakami-gun, JP;
Yuichi Teramura, Ashigarakami-gun, JP;
Sadato Akahori, Ashigarakami-gun, JP;
Karin Kuroiwa, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An optical tomograph is equipped with: a light source unit for emitting a plurality of light beams, the wavelengths of which are swept within different predetermined wavelength bands respectively with the same period; light divider which divides each light beam into a measuring light beam and a reference light beam; light beam combiner which combines reflected light beams, which are the measuring light beams reflected by a measurement target when the measuring light beams are irradiated thereon, with a reference light. An interference light detector detects an interference light beam, which is formed by the reflected light beam and the reference light combined by the light beam combiner, for each of the light beams as an interference signal. A tomographic image processor generates a tomographic image of the measurement target employing the plurality of interference signals detected by the interference light detector.