The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2010
Filed:
Sep. 28, 2007
Hiroaki Yamamoto, Kanagawa, JP;
Toshihito Kimura, Kanagawa, JP;
Hitoshi Shimizu, Kanagawa, JP;
Masashi Hakamata, Kanagawa, JP;
Hiroaki Yamamoto, Kanagawa, JP;
Toshihito Kimura, Kanagawa, JP;
Hitoshi Shimizu, Kanagawa, JP;
Masashi Hakamata, Kanagawa, JP;
Fujifilm Corporation, Tokyo, JP;
Abstract
Provided are a detection apparatus, a detection method and an optically transparent member, which can detect a decrease in a precision. A convolution is performed by a convolution portioncontained in an image processing portion, to acquire the distribution information indicating the light intensity distribution of a light beam, which is totally reflected at the interface and which is incident at a plurality of angles to an dielectric blockso as to be totally reflected at the interface of the dielectric block. A spatial frequency resolution is performed on the light intensity distribution indicated by the distribution information acquired, by a detection precision evaluating portioncontained in the image processing portion, to thereby derive the light intensity distribution of each spatial frequency of the light beam. The precision is detected by comparing the light intensity distribution derived, with a threshold value predetermined for each spatial frequency.