The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Sep. 11, 2007
Applicants:

Michael J. Dailey, Jr., Painted Post, NY (US);

Garrett A. Piech, Horseheads, NY (US);

Gordon M. Shedd, Lawrenceville, PA (US);

Michael B. Webb, Lindley, NY (US);

Elvis A. Zambrano, Corning, NY (US);

Inventors:

Michael J. Dailey, Jr., Painted Post, NY (US);

Garrett A. Piech, Horseheads, NY (US);

Gordon M. Shedd, Lawrenceville, PA (US);

Michael B. Webb, Lindley, NY (US);

Elvis A. Zambrano, Corning, NY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 11/14 (2006.01); G01J 3/30 (2006.01); G01J 3/28 (2006.01); G01N 21/00 (2006.01); G01N 21/75 (2006.01); G01N 21/62 (2006.01); G01N 21/76 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical interrogation system and method are described herein that are capable of detecting and correcting a positional misalignment of a label independent detection (LID) microplate so that the LID microplate can be properly interrogated after being removed from and then re-inserted back into a microplate holder/XY translation stage.


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