The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Jun. 09, 2006
Applicants:

Soung Yeoul Eom, Gumi-si, KR;

Dong Woo Kang, Gumi-si, KR;

Bong Chul Kim, Daegu, KR;

Ki Soub Yang, Gumi-si, KR;

Inventors:

Soung Yeoul Eom, Gumi-si, KR;

Dong Woo Kang, Gumi-si, KR;

Bong Chul Kim, Daegu, KR;

Ki Soub Yang, Gumi-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1343 (2006.01); G02R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A TFT substrate for inspection for shorts, includes a substrate defined by a display area and a non-display area outside the display area; a plurality of first and second lines formed in the display area on the substrate; pad lines formed to be extended from one side of each of the first lines to the non-display area; a plurality of signal inspection bars formed in the non-display area to cross the pad lines at one side of the pad lines; a shorting inspection bar spaced apart from the outermost signal inspection bar at a predetermined interval and substantially parallel with the signal inspection bar and connected to the pad lines; and a plurality of transparent electrode patterns partially overlapped with the pad lines and connected to one of the signal inspection bars.


Find Patent Forward Citations

Loading…