The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2010

Filed:

May. 06, 2004
Applicants:

Nicolai Kosche, San Francisco, CA (US);

Brian J. Wylie, Falkirk, GB;

Christopher P. Aoki, Los Altos, CA (US);

Martin S. Itzkowitz, Redwood City, CA (US);

Inventors:

Nicolai Kosche, San Francisco, CA (US);

Brian J. Wylie, Falkirk, GB;

Christopher P. Aoki, Los Altos, CA (US);

Martin S. Itzkowitz, Redwood City, CA (US);

Assignee:

Oracle America, Inc., Redwood City, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01); G06F 9/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Data address profiling allows determination of sources of code execution hindrance with different perspectives of memory references and allows correlation of sampled runtime events and memory reference objects, such as cache lines. Associating sampled runtime events with data addresses provides for efficient and targeted optimization of code with respect to data addresses and physical and/or logical memory reference objects (e.g., memory segments, heap variables, variable instances, stack variables, etc.). An instruction instance is identified in relation to a sampled runtime event. A data address is determined from the instruction instance. From the determined address, a memory reference object is ascertained.


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