The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7827470 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 02, 2010

Filed:

Oct. 05, 2005
Applicants:

Jaekyun Moon, Minneapolis, MN (US);

Jihoon Park, Minneapolis, MN (US);

Jun Lee, Yongin-si, KR;

Inventors:

Jaekyun Moon, Minneapolis, MN (US);

Jihoon Park, Minneapolis, MN (US);

Jun Lee, Yongin-si, KR;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatuses and methods for detecting error events in a codeword reproduced by perpendicular magnetic recording medium (PMR. The method includes: generating cyclic redundancy check (CRC) parity bits based on a generator polynomial for a source information sequence to be recorded on PMR medium and recording a codeword in which the generated CRC parity bits are added to the source information sequence; and reading the recorded codeword and an error event in the read codeword. It is possible to detect error events when a codeword recorded by PMR is read, using a small number of bits.


Find Patent Forward Citations

Moon, Jaekyun. (2010). Method of detecting error event in codeword reproduced by perpendicular magnetic recording medium and apparatus using the same (U.S. Patent No. 7827470). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7827470

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