The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2010
Filed:
May. 24, 2006
Theodore J. Bohizic, Hyde Park, NY (US);
Mark H. Decker, Rhinebeck, NY (US);
Ali Y. Duale, Poughkeepsie, NY (US);
Theodore J. Bohizic, Hyde Park, NY (US);
Mark H. Decker, Rhinebeck, NY (US);
Ali Y. Duale, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and program product are provided for establishing one or more decimal floating point (DFP) operand for facilitating testing of a decimal floating point instruction. The method includes obtaining an encoded DFP operand previously generated for testing the decimal floating point instruction, and logically modifying at least one bit of the encoded DFP operand without decoding the encoded DFP operand to obtain an additional encoded DFP operand. In one embodiment, m sequential bits of the encoded DFP operand, n randomly generated bits (wherein n=m), and a logical operation (such as an AND, OR, XOR or SHIFT) are employed in modifying the previously generated, encoded DFP operand.