The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2010

Filed:

Jan. 04, 2005
Applicants:

Thomas Hutter, Niederrohrdorf, CH;

Christoph Heitz, Elgg, CH;

Jurgen Schawe, Bichelsee, CH;

Inventors:

Thomas Hutter, Niederrohrdorf, CH;

Christoph Heitz, Elgg, CH;

Jurgen Schawe, Bichelsee, CH;

Assignee:

Mettler-Toledo AG, Greifensee, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Some of the embodiments of the present disclosure provide a method for analyzing a substance, where the method includes subjecting the substance to a dynamic excitation to produce an observable response, and determining a characteristic quantity of the substance based on a correlation between the excitation and the response. The correlation between the excitation and the response is expressed by a parametric model for which a specific model structure with a finite number of unspecified parameters is preset. The determining a characteristic quantity of the substance includes calculating the parameters of the model from values of the excitation and the response in a time domain, determining from the calculated parameters a transfer function in a frequency range, and calculating the characteristic quantity directly from the transfer function. Other embodiments are also described and claimed.


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