The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2010
Filed:
Jun. 15, 2007
John Washbourne, Walnut Creek, CA (US);
Earl Frederic Herkenhoff, Orinda, CA (US);
John Washbourne, Walnut Creek, CA (US);
Earl Frederic Herkenhoff, Orinda, CA (US);
Chevron U.S.A. Inc., San Ramon, CA (US);
Abstract
A method for obtaining enhanced seismic data and optimized inverted reflectivities includes computing statistical well characterizations based upon band-limited well reflectivities for a subsurface region. Sets of processed seismic data are computed by applying differing processing sequences to seismic data corresponding to the subsurface region. Inverted reflectivities are computed by inverting the sets of processed seismic data. Statistical seismic characterizations are computed based upon the inverted reflectivities. Statistical difference measurements (SDMs) are computed between the statistical well and seismic characterizations. An optimal processing sequence is selected based upon the computed SDMs. Enhanced seismic data is obtained by processing the seismic data corresponding to the subsurface region. An optimal seismic inversion algorithm is obtained based upon the computed SDMs. The seismic data is inverted using the optimal seismic inversion algorithm to produce a set of optimized inverted reflectivities.