The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2010

Filed:

Dec. 11, 2006
Applicants:

Ruofei Zhang, San Jose, CA (US);

Ramesh R. Sarukkai, Union City, CA (US);

Subodh Shakya, San Jose, CA (US);

Inventors:

Ruofei Zhang, San Jose, CA (US);

Ramesh R. Sarukkai, Union City, CA (US);

Subodh Shakya, San Jose, CA (US);

Assignee:

Yahoo! Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are described herein for automatically evaluating the quality of digital images based on one or more color characteristics of the images. In some embodiments, a quality metric that indicates the likelihood that the digital images convey semantics is generated based on color characteristics of the digital images. The quality metric may be used, for example, to determine which keyframe to use to make a thumbnail to represent video data. In some embodiments, feature values are generated for an image based on color characteristics of the image, and the feature values are assigned to bins. In such embodiments, the quality metric may be generated to indicate how uniform the distribution of feature values is among the bins.


Find Patent Forward Citations

Loading…