The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2010
Filed:
Mar. 31, 2005
Applicants:
Michitsugu Mori, Tokyo, JP;
Hideaki Tezuka, Tokyo, JP;
Inventors:
Michitsugu Mori, Tokyo, JP;
Hideaki Tezuka, Tokyo, JP;
Assignee:
The Tokyo Electric Power Company, Incorporated, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
A fluid measurement system includes a long focus optical system at a CCD camera, and an image processor for comparing particle images taken at two time points for analysis. The long focus optical system is provided with a shield which shields a part including a central portion of a main mirror at an arbitrary shield rate. As a result, the particle image of a tracer is enlarged with its contour kept clear, that is, in focus, and therefore, the image having a luminance which allows analysis by the PIV method can be taken in spite of use of the long focus optical system.