The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2010
Filed:
Mar. 10, 2009
Stefan Böhm, Oberasbach, DE;
Peter Durlak, Erlangen, DE;
Volker Heer, Gundelsheim, DE;
Martin Kolarjk, Nürnberg, DE;
Stefan Böhm, Oberasbach, DE;
Peter Durlak, Erlangen, DE;
Volker Heer, Gundelsheim, DE;
Martin Kolarjk, Nürnberg, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for checking an x-ray diagnostic apparatus is provided. Fluoroscopic series of x-ray images of a technical phantom are digitally acquired and stored. Difference between a dynamic image and a background image is calculated. A measuring field is predicted. Priori information about the shape of a clinically relevant object is determined. Hough transformation on a gray value image corresponding to the difference is applied. Contrast of the object from the Hough-transformed gray value image is determined. A square of the determined contrast is calculated. A noise variance is calculated by determining a sum of a noise variance of a homogenous image region and a variance of the background image. A contrast-to-noise ratio of the determined contrast and the calculated noise variance is determined. A square of the contrast-to-noise ratio is dynamically averaged. A Clinical Relevant Fluoroscopy Performance index for the x-ray diagnostic apparatus is determined.