The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2010
Filed:
Sep. 11, 2009
David Allen Langan, Clifton Park, NY (US);
John Eric Tkaczyk, Delanson, NY (US);
James Walter Leblanc, Niskayuna, NY (US);
Colin R. Wilson, Niskayuna, NY (US);
Xiaoye Wu, Rexford, NY (US);
Dan Xu, Schenectady, NY (US);
Thomas Matthew Benson, Clifton Park, NY (US);
Jed Douglas Pack, Glenville, NY (US);
David Allen Langan, Clifton Park, NY (US);
John Eric Tkaczyk, Delanson, NY (US);
James Walter LeBlanc, Niskayuna, NY (US);
Colin R. Wilson, Niskayuna, NY (US);
Xiaoye Wu, Rexford, NY (US);
Dan Xu, Schenectady, NY (US);
Thomas Matthew Benson, Clifton Park, NY (US);
Jed Douglas Pack, Glenville, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A CT system includes a gantry, an x-ray source, a generator configured to energize the x-ray source to a first kVp and to a second kVp, a detector, and a controller. The controller is configured energize the x-ray source to the first kVp for a first time period, subsequently energize the x-ray source to the second kVp for a second time period, integrate data for a first integration period that includes a portion of a steady-state period of the x-ray source at the first kVp, integrate data for a second integration period that includes a portion of a steady-state period of the x-ray source at the second kVp, compare a signal-to-noise ratio (SNR) during the first integration period (SNR) and the second integration period (SNR), adjust an operating parameter of the CT system to optimize an SNRwith SNR, and generate an image using the integrated data.