The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7826584 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 02, 2010

Filed:

Jul. 03, 2007
Applicants:

Soo-jin Paek, Suwon-si, KR;

Jae-wook Lee, Yongin-si, KR;

Ho-keun Cho, Yongin-si, KR;

Inventors:

Soo-Jin Paek, Suwon-si, KR;

Jae-wook Lee, Yongin-si, KR;

Ho-keun Cho, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D 3/24 (2006.01); H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

In phase locked loop, a phase detector detects a phase difference between a first clock signal and a second clock signal and output a first output signal based on the detected difference. A charge pump generates a control voltage in response to the first output signal from the phase detector. A voltage-controlled oscillator generates the second clock signal. A controller controls the control voltage such that the phase difference between the first clock signal and the second clock signal is increased in response to a burn-in test mode signal.


Find Patent Forward Citations

Paek, Soo-Jin. (2010). Phase locked loops capable of burn-in testing with increased locking range and burn-in testing method thereof (U.S. Patent No. 7826584). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7826584

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