The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2010

Filed:

Jul. 22, 2005
Applicants:

Pai-chu Hsieh, Taipei, TW;

Tzu-hsin Wang, Hsinchu, TW;

Chien-yu Lin, Sanchong, TW;

Inventors:

Pai-Chu Hsieh, Taipei, TW;

Tzu-Hsin Wang, Hsinchu, TW;

Chien-Yu Lin, Sanchong, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for object edge detection in a macroblock and a method for deciding quantization scaling factor are disclosed. This method calculates and compares the pixel means and means of absolutely difference of a plurality of pixel blocks in a macroblock to achieve the purpose of detecting if there is an object edge or flat area in a macroblock. In the meantime, the image structure of macroblock is analyzed and classified and its related messages are used for bit rate control, such that the visual effect of the compressed image can be appropriately enhanced.


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Hsieh, Pai-Chu. (2010). Method for object edge detection in macroblock and method for deciding quantization scaling factor (U.S. Patent No. 7826533). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7826533

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