The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2010

Filed:

Oct. 06, 2008
Applicants:

Hsi-yu Chen, Taipei, TW;

Chien-kuo Kuan, Taipei, TW;

Inventors:

Hsi-Yu Chen, Taipei, TW;

Chien-Kuo Kuan, Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning apparatus for preventing defocus aberration is provided. The scanning apparatus includes a flatbed scanning portion and a scanning module. The flatbed scanning portion includes a glass platform. The scanning module includes a scanning module case, a light source, multiple reflective mirrors, a lens, an optical sensing element, a printed circuit board and a metallic post. The metallic post is interconnected between the scanning module case and the printed circuit board. The printed circuit board is not in direct contact with the scanning module case so as to prevent defocus aberration resulting from thermal expansion.


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