The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2010

Filed:

Apr. 23, 2008
Applicants:

Hsin-li Lin, Taipei Hsien, TW;

I-pen Chien, Taipei Hsien, TW;

Kuang-wei Lin, Taipei Hsien, TW;

Po-yuan Lai, Taipei Hsien, TW;

Inventors:

Hsin-Li Lin, Taipei Hsien, TW;

I-Pen Chien, Taipei Hsien, TW;

Kuang-Wei Lin, Taipei Hsien, TW;

Po-Yuan Lai, Taipei Hsien, TW;

Assignee:

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing method is configured for testing parameters of a color wheel. The color wheel includes a color filter, which includes three sector-shaped filter segments and a motor for driving the filter segments of the color filter to rotate. The color filter is driven to rotate. Light is emitted toward the color filter of the color wheel, and reflected back by the color filter. Boundary impulses are generated according to changes in intensity of the light reflected back by the color filter. Based on relationships between the boundary impulses, central angles of the filter segments of the color wheel are calculated.


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