The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2010

Filed:

Mar. 30, 2006
Applicants:

Tingjun Wen, Kanata, CA;

David Walter Carr, Nepean, CA;

Tadeusz Kwasniewski, Ottawa, CA;

Inventors:

Tingjun Wen, Kanata, CA;

David Walter Carr, Nepean, CA;

Tadeusz Kwasniewski, Ottawa, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 1/00 (2006.01); H03K 19/20 (2006.01); H03K 19/094 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit comparator is provided that determines non-strict inequalities between operands applied thereto. Each comparator includes at least one n-bit comparator cell. This comparator cell is configured to determine a non-strict inequality between a first n-bit operand (e.g., A[n−1, . . . , 0]) and a second n-bit operand (e.g., B[n−1, . . . , 0]). The comparator cell determines the non-strict inequality by computing a control output signal C(or its complement), where: 'n' is a positive integer greater than one and Cis a control input signal that specifies an interpretation to be given to the control output signal C.


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