The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2010

Filed:

Oct. 31, 2005
Applicants:

Jacob N. Wohlstadter, Rockville, MD (US);

James Wilbur, Germantown, MD (US);

George Sigal, Rockville, MD (US);

Mark Martin, Rockville, MD (US);

Liang-hong Guo, Gaithersburg, MD (US);

Alan Fischer, Cambridge, MA (US);

Jon Leland, Silver Spring, MD (US);

Mark A. Billadeau, Mt. Airy, MD (US);

Larry R. Helms, Germantown, MD (US);

Ramin Darvari, Waltham, MA (US);

Inventors:

Jacob N. Wohlstadter, Rockville, MD (US);

James Wilbur, Germantown, MD (US);

George Sigal, Rockville, MD (US);

Mark Martin, Rockville, MD (US);

Liang-Hong Guo, Gaithersburg, MD (US);

Alan Fischer, Cambridge, MA (US);

Jon Leland, Silver Spring, MD (US);

Mark A. Billadeau, Mt. Airy, MD (US);

Larry R. Helms, Germantown, MD (US);

Ramin Darvari, Waltham, MA (US);

Assignee:

Meso Scale Technology LLP, Gaithersburg, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/551 (2006.01); G01N 33/553 (2006.01);
U.S. Cl.
CPC ...
Abstract

Materials and methods are provided for producing patterned multi-array, multi-specific surfaces for use in diagnostics. The invention provides for electrochemiluminescence methods for detecting or measuring an analyte of interest. It also provides for novel electrodes for ECL assays. Materials and methods are provided for the chemical and/or physical control of conducting domains and reagent deposition for use multiply specific testing procedures.


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