The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2010
Filed:
Jul. 31, 2008
Hiroyuki Hiramatsu, Toyokawa, JP;
Yukinobu Ban, Nishio, JP;
Hiroyuki Hiramatsu, Toyokawa, JP;
Yukinobu Ban, Nishio, JP;
Nidek, Co., Ltd., Gamagori-shi, JP;
Abstract
An ophthalmic ultrasonic measurement apparatus capable of narrowing differences in measurement results obtained by the apparatus which are made because of differences among examiners who operate the apparatus comprises an ultrasonic probe arranged to be brought into contact with a cornea of an examinee's eye, a calculation unit arranged to obtain a measured value of a length from the cornea to a given section inside the eye based on an echo from the eye by an ultrasonic wave which is emitted from the probe, and a memory arranged to store information on examiners and adjustment information for narrowing differences in measured values of the length which are made because of differences among the examiners while the adjustment information is associated with the examiners' information, wherein the calculation unit corrects the obtained measured value using the stored adjustment information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile