The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2010

Filed:

Mar. 11, 2008
Applicants:

Faye D. Baker, Burlington, VT (US);

Mark R. Beckenbaugh, Rochester, MN (US);

Jason J. Freerksen, Rochester, MN (US);

Mark D. Levy, Milton, VT (US);

Inventors:

Faye D. Baker, Burlington, VT (US);

Mark R. Beckenbaugh, Rochester, MN (US);

Jason J. Freerksen, Rochester, MN (US);

Mark D. Levy, Milton, VT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, computer system and program product introduce adding a variable performance ranking parameter to a diagram of a circuit to drive implementation of modifications that are yield improving, performance boosting, or performance-neutral. The information is paired to accomplish a more complete design for manufacturability modification in the design of circuits implemented on chips. In this matter, both yield and chip performance are improved.


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