The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2010

Filed:

May. 31, 2001
Applicants:

Sashikanth Chandrasekaran, Belmont, CA (US);

Chiyeh Hou, Pleasanton, CA (US);

Tak F. Wang, Hayward, CA (US);

Inventors:

Sashikanth Chandrasekaran, Belmont, CA (US);

Chiyeh Hou, Pleasanton, CA (US);

Tak F. Wang, Hayward, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 15/173 (2006.01); G06F 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for estimating data conflicts in a multi-node system is disclosed. According to an embodiment of the invention, tracing the execution of a workload on a single node and analyzing the trace records makes it possible to predict how many data conflicts would occur if the workload were executed across multiple nodes. Also disclosed is a method and mechanism for generating a load distribution plan for a multi-node system.


Find Patent Forward Citations

Chandrasekaran, Sashikanth. (2010). Method and mechanism for predicting data conflicts and generating a load distribution plan in a multi-node system (U.S. Patent No. 7822870). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7822870

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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