The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Apr. 30, 2008
Vibhor Tandon, Karnataka, IN;
Deepak Bhandiwad, Karnataka, IN;
Gowtham Anne, Karnataka, IN;
Karthikeya S. Ramanathan, Karnataka, IN;
Vibhor Tandon, Karnataka, IN;
Deepak Bhandiwad, Karnataka, IN;
Gowtham Anne, Karnataka, IN;
Karthikeya S. Ramanathan, Karnataka, IN;
Honeywell International Inc., Morristown, NJ (US);
Abstract
A method includes receiving a first proposed value or attribute for a parameter associated with a field device. The field device is or will be used in a process control system. The method also includes determining whether the first proposed value or attribute is valid using a device description associated with the field device. The method further includes, if the first proposed value or attribute is not valid, receiving a second proposed value or attribute for the parameter associated with the field device and determining whether the second proposed value or attribute is valid. The determinations of whether the first and second proposed values or attributes are valid could occur when the field device is offline in the process control system. The method could further include receiving a configuration having multiple values or attributes for multiple parameters associated with the field device and validating at least some of those values or attributes.