The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2010

Filed:

Jan. 15, 2008
Applicants:

Andrew Duchon, Somerville, MA (US);

Kari Kelton, Washington, DC (US);

Pacey Foster, Dorchester, MA (US);

Kara Orvis, Melrose, MA (US);

Inventors:

Andrew Duchon, Somerville, MA (US);

Kari Kelton, Washington, DC (US);

Pacey Foster, Dorchester, MA (US);

Kara Orvis, Melrose, MA (US);

Assignee:

Aptima, Inc, Woburn, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates in general to methods and systems for comparing and maximizing the appropriateness of a first set of one or more data objects to a set of second data objects. In one embodiment, the first set of data objects represent one or more tasks to be fulfilled by a set of capabilities represented by the second data objects. In one embodiment, this invention provides an effective and accurate method and system to compare and maximize the appropriateness between the requirements of a task and the second set's capabilities, while these capabilities and requirements are contained, even if only latently, in data objects such as written documents, electronic databases or other sources of data and information. In one embodiment, topic modeling techniques are utilized to compare the data objects.


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