The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Sep. 08, 2006
Hideaki Endo, Tokyo, JP;
Akitsugu Kagayama, Tokyo, JP;
Atsuhiro Tsuchiya, Tokyo, JP;
Kazuhiro Hasegawa, Tokyo, JP;
Hideaki Endo, Tokyo, JP;
Akitsugu Kagayama, Tokyo, JP;
Atsuhiro Tsuchiya, Tokyo, JP;
Kazuhiro Hasegawa, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An observation apparatus includes an incident-light illumination optical system, a transmitting illumination optical system, an imaging unit, an input device, a storage unit, an imaging controller, a microscope controller, an imaging information management unit. The imaging information management unit compares an area position, of an imaging area of the imaging unit, indicated by position information input from the input device with an area position stored in the storage unit to determine whether the area position indicated by the position information is stored in the storage unit. When the area position is not stored in the storage unit, the imaging controller controls the imaging unit to image the specimen and to generate an observation image, and stores the observation image in the storage unit. The microscope controller controls one of the optical systems to illuminate the specimen only during an imaging period, when the imaging unit images the specimen.